Compact 30 mm² silicon-drift EDS detector for routine SEM microanalysis. Oxford Instruments specifies Mn Kα resolution below 129 eV at 100 kcps, mapping above 1,000,000 cps and Be-to-Cf detection for the 30 mm² version.
Learn More
Description
Oxford Instruments Xplore 30 EDS System
Xplore 30 is a compact silicon-drift detector for routine energy-dispersive X-ray spectroscopy in a compatible scanning electron microscope. It can be supplied with AZtecOne or AZtecLive software depending on the required workflow.
| Active area | 30 mm² |
|---|---|
| Guaranteed Mn Kα resolution | <129 eV at 100,000 cps |
| Mapping count rate | >1,000,000 cps |
| Quantitative analysis rate | >100,000 cps |
| Detection range stated by Oxford Instruments | Beryllium to californium for the 30 mm² version |
| Typical functions | Point identification, spectra, quantitative analysis, maps and line scans, software-package dependent |
Actual low-energy performance depends on window, geometry, specimen, beam conditions and calibration. Confirm SEM compatibility, port geometry, working distance, take-off angle, electronics, software tier, computer, installation and standards before ordering.
